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Differential Interference Contrast
The use of Differential Interference Contrast (DIC) with large format line scan sensors and high resolution optics enable semiconductor, FPD, electronics and other industries to quickly image subtle surface structures and details which are not normally visible. The ability to image and subsequently analyze these structures leads to greater manufacturing
efficiencies and production throughput.
Automated Focus and Illumination
The LFOV DIC microscope is able to incorporate any one of WDIs Autofocus Sensors and High Power LED illumination options to create a completely autonomous inspection system. The flexibility in autofocus and illumination allows the LFOV DIC to be used in a wide variety of manufacturing applications including semiconductor, FPD, OLED, packaging and photovoltaic and solar panel inspection.
Practical Design
To meet the requirements of in line manufacturing, the LFOV DIC microscope features rugged industrial components, a small
footprint and low weight. Its modular nature allows it to be completely upgradable, ensuring the best performance for all

 

current and future applications.

 

  

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